The reach of direct detection experiments for dark matter (DM) candidates with masses below a GeV faces limitations stemming from two critical challenges. Firstly, prevailing light-DM experiments grapple with a substantial number of unexplained background events that severely limit their sensitivity. Secondly, sub-GeV DM detectors lose sensitivity towards low DM masses due to constraints in detector thresholds. In this talk we discuss these issues and introduce two novel technologies aimed at their resolution: the Dual- Sided Charge-Coupled Device (DCCD) and doped-semiconductor DM detectors.
The DCCD is a newly proposed imaging apparatus that is projected to deliver multiple-order of magnitude improvements in background rejection and timing capabilities. Doped-semiconductor detectors, on the other hand, are low-threshold devices that have the potential to test DM candidates with sub-MeV masses. These advancements translate into significant improvements in the discovery reach for concrete DM models. Moreover, the impact of these novel devices is wide-ranging, extending beyond searches for new physics. The DCCD, in particular, has the potential of becoming the world’s most sensitive scientific camera, and could facilitate substantial progress in near-IR, optical and X-ray astronomy.
The McDonald Institute seminar will be held in Stirling 501. A zoom link is also available and was shared via email from Aaron Vincent. Please reach out to him to get access.